Some may wonder why the founders of ASD Inc. chose near-infrared (NIR), or NIR reflectance spectroscopy, as their technological foundation. NIR is a highly flexible form of analysis, which can be applied to a broad range of research and industrial process applications. Long a staple technology in remote sensing, NIR reflectance spectroscopy has become popular within industrial markets as a cost-effective tool for measuring materials to optimize processes and manage costs.

Capable of examining irregular surfaces with the same ease as a carefully prepared sample, NIR is non-destructive, and requires little or no sample preparation. It can also be used to analyze multiple constituents in a single scan. Combined with a calibration model, NIR analysis is a powerful tool for a multitude of applications. ASD spectrometer and spectroradiometer systems convert measured data into actionable information to help optimize processes or improve research.

The Technical Explanation

NIR reflectance spectroscopy is a method that makes use of the near infrared region of the electromagnetic spectrum (from about 700 to 2500 nanometers). By measuring light scattered off of and through a sample, NIR reflectance spectra can be used to quickly determine a material’s properties without altering the sample. ASD has taken NIR technology a step further with the Goetz spectrometer, a hybrid system that uses a combination of visible and NIR regions (Vis/NIR) to include wavelengths from 350 nm to 2500 nm. The instruments have three separate spectrographs optimized for specific wavelength regions. This design features excellent stray light performance, high photometric sensitivity, and a rapid scan time not attainable by most traditional NIR instruments.