March 09, 2015 - March 12, 2015
Visit PANalytical at booth #1440 to demo the new QualitySpec Trek and to witness the wide range of PANalytical solutions. On display will be X-ray diffraction, X-ray fluorescence, Near infrared and fusion technologies. The PAN Challenge will entertain once again with a participants versus instrument challenge to correctly identify local libations.
This year PANalytical is also contributing with a short course "Thin film and surface analysis by X-ray scattering" instructed by Scott Speakman Ph.D and Mike Hawkridge Ph.D. See how PANalytical can help you get insight on your materials with advanced expertise and renowned customer support.
New Orleans, Louisiana, USA
Booth # 1440